Additive manufacturing of lensed fiber probes for wafer-level testing and improved optical coupling
Operational since 2017, since 2023 as Keystone Photonics.
Product Range
Custom Optics
- Large variety of standard models
- All shown designs are validated by performance and reliability test and
used for a large variety of customer’s application
Fiber Array
• Fiber arrays tailored for wafer and die-level testing
• With lid, no lid, narrow etc
Large quantity of 8ch fiber arrays with 127 µm and 250 µm on stock. Fiber arrays with up to 64 ch on stock. |
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Lensed fiber arrays for both die and wafer level testing of angled facets (e.g. InP laser, SOA, SLED). | |
Any pitch, fiber type, mixed fiber arrays, PM fiber arrays, cryo, UV, VIS NIR fiber arrays available upon request. Every chanel of a fiber array can be equipped with a different optics. |
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Range of 3D-printed marker for top- and bottom view camera alignment. Suitable for surface and trench coupling. |
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Range of 3D-printed marker for top- and bottom view camera alignment. Suitable for surface and trench coupling. |
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Photonic integrated circuits (PIC) can be used as a means for pitch equalization or pitch reduction to 20 µm. Such probe heads allow testing of ultra-low pitch photonic integrated circuits both using grating and edge-coupled devices. PIC may be equipped with 3D-printed mirror optics or a straight lens.
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Custom Fiber Array Mounting
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Test & Validation
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Optional mode-field and transmission measurements. |
Packaging
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Application Areas
Business Segments
Design Services
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Standard Products
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Custom Products
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Request Form for Standard Products
Standard Corpus Types (µm)
Corpus type A
Corpus type B
Corpus type C
Corpus type D
Please select features
Optional marker structure needed? – Take your pick!
- All calculations were done with Gaussian approximation
- All MFD are specified at 1/e² intensity level
- MFDs correspond to UHNA4 and SMF28 fiber (except for smallest MFD)
- WD is measured from apex of lens to waist
- Measured coupling efficiency is pending, estimated coupling is 0.5 dB for large MFD,
1 dB for smallest MFD, TIR surface has 0.1-0.3 dB penalty
Our Technology in a Nutshell
Optical Wafer-Level Testing
Watch Keystone Photonics: 1 hour 23 minutes
Watch Keystone Photonics: 1 hour 42 minutes
Our jobs
We do not have open positions at the moment, but you can always send us an unsolicited application at jobs@keystone-photonics.com
Reliable and industry-proven fabrication services of validated photonic components for wafer-level testing and free-space coupling.